Paper / report
Lithographic performances of aryl sulfonate ester-modified polystyrenes as nonchemically amplified resistsCee® 200X; Apogee® Bake Plate
This patent describes photoresist preparation, post-exposure bake and topcoat removal for immersion-fluid testing. The workflow uses Cee® 100CB.
Wafer-preparation experiment identifies CEE100CB spinner/hotplate and subsequent spin-cleaning of the topcoat.
This entry describes a patent example. Consult the original document for the experimental procedure and the scope of its claims. Materials recorded for this reference include Photoresist.
Google Patents. Apparatus and method for recirculating alkane impregnation solution.
Open original source ↗Application summary prepared by Cee. The original source remains the authority for its methods and findings.
SEMICON EUROPA · 10–13 NOVEMBER
Meet Jacob, CEE’s Global Sales Director, in Munich with our partner SiSTEM Technology.
Stand C1353 · Messe München
Spin coating, bake and chill, temporary bonding and debonding.
Mention Jacob from CEE in SiSTEM’s booking form.